Title :
Modeling and formal verification of the Fairisle ATM switch fabric using MDGs
Author :
Tahar, Sofiène ; Song, Xiaoyu ; Cerny, Eduard ; Zhou, Zijian ; Langevin, Michel ; Aït-Mohamed, Otmane
Author_Institution :
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada
fDate :
7/1/1999 12:00:00 AM
Abstract :
In this paper, we present several techniques for modeling and formal verification of the Fairisle asynchronous transfer mode (ATM) switch fabric using multiway decision graphs (MDGs). MDGs represent a new class of decision graphs which subsumes Bryant´s reduced ordered binary decision diagrams (ROBDDs) while accommodating abstract sorts and uninterpreted function symbols. The ATM device we investigated is in use for real applications in the Cambridge University Fairisle network. We modeled and verified the switch fabric at three levels of abstraction: behavior, and register transfer level (RTL) and gate levels. In a first stage, we validated the high-level specification by checking specific safety properties that reflect the behavior of the fabric in its real operating environment. Using the intermediate abstract RTL model, we hierarchically completed the verification of the original gate-level implementation of the switch fabric against the behavioral specification. Since MDGs avoid model explosion induced by data values, this work demonstrates the effectiveness of MDG based verification as an extension of ROBDD-based approaches. All the verifications were carried out automatically in a reasonable amount of CPU time
Keywords :
asynchronous transfer mode; binary decision diagrams; formal verification; graph theory; high level synthesis; Bryant´s reduced ordered binary decision diagrams; Fairisle ATM switch fabric; MDGs; ROBDD-based approaches; abstract sorts; behavior level; behavioral specification; formal verification; gate level; high-level specification; intermediate abstract RTL model; multiway decision graphs; real operating environment; register transfer level; specific safety properties; uninterpreted function symbols; Asynchronous transfer mode; B-ISDN; Boolean functions; Data structures; Explosions; Fabrics; Formal verification; Safety; Switches; System testing;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on