Title :
New 4-Bit Transient-to-Digital Converter for System-Level ESD Protection in Display Panels
Author :
Ker, Ming-Dou ; Yen, Cheng-Cheng
Author_Institution :
Nanoelectron. & Gigascale Syst. Lab., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
A new on-chip 4-bit transient-to-digital converter for system-level electrostatic discharge (ESD) protection design is proposed. The proposed converter is designed to detect ESD-induced transient disturbances and transfer different ESD voltages into digital codes under system-level ESD tests. The experimental results in a 0.13- μm CMOS integrated circuit with 1.8-V devices have confirmed the detection function and digital output codes. The proposed on-chip transient-to-digital converter can be codesigned with firmware operations to effectively enhance immunity of display systems against system-level ESD stresses.
Keywords :
CMOS integrated circuits; display instrumentation; electrostatic discharge; power convertors; power system protection; power system transients; CMOS integrated circuit; ESD protection; digital codes; display panels; electrostatic discharge; on-chip transient-to-digital converter; size 0.13 mum; system-level ESD tests; transient disturbances; voltage 1.8 V; CMOS integrated circuits; Discharges; Electrostatic discharge; Microprogramming; System-on-a-chip; Transient analysis; Converter; electromagnetic compatibility; electrostatic discharge (ESD); system-level ESD test; transient detection circuit;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2011.2157292
