• DocumentCode
    1522765
  • Title

    A 0.5 V single power supply operated high-speed boosted and offset-grounded data storage (BOGS) SRAM cell architecture

  • Author

    Yamauchi, Hiroyuki ; Iwata, Toru ; Akamatsu, Hironori ; Matsuzawa, Akira

  • Author_Institution
    Corp. Semicond. Dev. Div., Matsushita Commun. Ind. Co. Ltd., Osaka, Japan
  • Volume
    5
  • Issue
    4
  • fYear
    1997
  • Firstpage
    377
  • Lastpage
    387
  • Abstract
    This paper proposes a 0.5 V/100 MHz/sub-5 mW-operated 1-Mbit SRAM cell architecture which uses a boosted and offset-grounded data storage (BOGS) scheme. The key target of BOGS is to minimize the charge amount supplied from the embedded charge pump circuits, which are required to boost the effective gate to source voltage (V/sub 0/=V/sub GS/-V/sub T/) up to 0.8 V necessary to achieve 100 MHz operation even at 0.5 V single power supply. Thus, the key low-power strategy of BOGS is "putting the right (higher efficiency) boosted power-supply from charge pump circuit into the right position (less power consumed transistor) in a SRAM cell." This paper is focused on why BOGS can realize a greater savings of the charge amount supplied from the boosted power-line and can reduce the power dissipation to /spl les/1/30.4 and /spl les/1/3.9 compared to the previously reported negative source-line drive (NSD) scheme and negative word-line drive (NWD) scheme, respectively, while achieving a 0.5 V/100 MHz operation.
  • Keywords
    CMOS memory circuits; SRAM chips; memory architecture; 0.5 V; 1 Mbit; 100 MHz; 5 mW; CMOS technology; boosted and offset-grounded data storage; charge pump circuit; high-speed BOGS SRAM cell; low-power circuit; power dissipation; single power supply operation; Central Processing Unit; Charge pumps; Circuits; Delay effects; Drives; Power dissipation; Power supplies; Random access memory; Subthreshold current; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.645064
  • Filename
    645064