DocumentCode
1522765
Title
A 0.5 V single power supply operated high-speed boosted and offset-grounded data storage (BOGS) SRAM cell architecture
Author
Yamauchi, Hiroyuki ; Iwata, Toru ; Akamatsu, Hironori ; Matsuzawa, Akira
Author_Institution
Corp. Semicond. Dev. Div., Matsushita Commun. Ind. Co. Ltd., Osaka, Japan
Volume
5
Issue
4
fYear
1997
Firstpage
377
Lastpage
387
Abstract
This paper proposes a 0.5 V/100 MHz/sub-5 mW-operated 1-Mbit SRAM cell architecture which uses a boosted and offset-grounded data storage (BOGS) scheme. The key target of BOGS is to minimize the charge amount supplied from the embedded charge pump circuits, which are required to boost the effective gate to source voltage (V/sub 0/=V/sub GS/-V/sub T/) up to 0.8 V necessary to achieve 100 MHz operation even at 0.5 V single power supply. Thus, the key low-power strategy of BOGS is "putting the right (higher efficiency) boosted power-supply from charge pump circuit into the right position (less power consumed transistor) in a SRAM cell." This paper is focused on why BOGS can realize a greater savings of the charge amount supplied from the boosted power-line and can reduce the power dissipation to /spl les/1/30.4 and /spl les/1/3.9 compared to the previously reported negative source-line drive (NSD) scheme and negative word-line drive (NWD) scheme, respectively, while achieving a 0.5 V/100 MHz operation.
Keywords
CMOS memory circuits; SRAM chips; memory architecture; 0.5 V; 1 Mbit; 100 MHz; 5 mW; CMOS technology; boosted and offset-grounded data storage; charge pump circuit; high-speed BOGS SRAM cell; low-power circuit; power dissipation; single power supply operation; Central Processing Unit; Charge pumps; Circuits; Delay effects; Drives; Power dissipation; Power supplies; Random access memory; Subthreshold current; Threshold voltage;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/92.645064
Filename
645064
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