• DocumentCode
    1522828
  • Title

    A process for the formation of submicron V-gate by micromachined V-grooves using GaInP/GaAs selective etching technique

  • Author

    Hong-Wei Chiu ; Nien-Show Ho ; Shey-Shi Lu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    22
  • Issue
    9
  • fYear
    2001
  • Firstpage
    420
  • Lastpage
    422
  • Abstract
    A process for the formation of submicron V-gates by V-grooves was demonstrated for the first time. The fabrication steps of V-gates consist of anisotropic wet etching of the undoped GaAs layer grown on top of a GaInP layer and subsequent metal evaporation and lift-off process. Owing to the outward slope of the sidewalls of the micromachined V-groove, submicron gate length could be easily obtained by normal 1 μm UV photolithography. The submicron V-gate process was also applied successfully to the fabrication of V-gate GaInP/GaAs/InGaAs metal semiconductor field effect transistors with a gate length of 0.6 μm.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; etching; gallium arsenide; indium compounds; micromachining; microwave field effect transistors; photolithography; 1 mum; GaInP-GaAs; GaInP/GaAs selective etching; In/sub 0.49/Ga/sub 0.51/P-GaAs-In/sub 0.2/Ga/sub 0.8/As; RF transistor; UV photolithography; V-gate GaInP/GaAs/InGaAs metal semiconductor field effect transistors; anisotropic wet etching; lift-off process; metal evaporation; micromachined V-grooves; submicron V-gate formation; submicron gate length; undoped GaAs layer; Anisotropic magnetoresistance; FETs; Fabrication; Gallium arsenide; Lithography; Micromachining; Micromechanical devices; Radio frequency; Resists; Wet etching;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.944326
  • Filename
    944326