• DocumentCode
    1522836
  • Title

    Gate-level power and current simulation of CMOS integrated circuits

  • Author

    Boliolo, A. ; Benini, Luca ; De Micheli, Giovanni ; Riccò, Bruno

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Bologna Univ., Italy
  • Volume
    5
  • Issue
    4
  • fYear
    1997
  • Firstpage
    473
  • Lastpage
    488
  • Abstract
    In this paper, we present a new gate-level approach to power and current simulation. We propose a symbolic model of complementary metal-oxide-semiconductor (CMOS) gates to capture the dependence of power consumption and current flows on input patterns and fan-in/fan-out conditions. Library elements are characterized and their models are used during event-driven logic simulation to provide power information and construct time-domain current waveforms. We provide both global and local pattern-dependent estimates of power consumption and current peaks (with accuracy of 6 and 10% from SPICE, respectively), while keeping performance comparable with traditional gate-level simulation with unit delay. We use VERILOG-XL as simulation engine to grant compatibility with design tools based on Verilog HDL. A Web-based user interface allows our simulator (PPP) to be accessed through the Internet using a standard web browser.
  • Keywords
    CMOS logic circuits; Internet; SPICE; circuit analysis computing; digital simulation; hardware description languages; logic CAD; time-domain analysis; CMOS integrated circuits; Internet; SPICE; VERILOG-XL; Web-based user interface; current flows; event-driven logic simulation; fan-in/fan-out conditions; gate-level current simulation; gate-level power simulation; input patterns; library elements; pattern-dependent estimates; power consumption; power information; simulation engine; symbolic model; time-domain current waveforms; CMOS integrated circuits; CMOS logic circuits; Circuit simulation; Delay estimation; Discrete event simulation; Energy consumption; Hardware design languages; Integrated circuit modeling; Libraries; Semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.645074
  • Filename
    645074