Application of Wide-Band Material Characterization Methods to Printable Electronics

Author

Pynttäri, Vesa J. ; Mäkinen, Riku M. ; Palukuru, Vamsi Krishna ; Östman, Kauko ; Sillanpää, Hannu P. ; Kanerva, Tomi ; Lepistö, Toivo ; Hagberg, Juha ; Jantunen, Heli

Author_Institution

Dept. of Electron., Tampere Univ. of Technol., Tampere, Finland

Volume

33

Issue

3

fYear

2010

fDate

7/1/2010 12:00:00 AM

Firstpage

221

Lastpage

227

Abstract

In this paper, characterization methods are presented with results from test structures printed with varying printing parameters and materials. It is shown that different process parameters affect both physical and electrical material properties and hence high-frequency material characterization is a vital part of the process providing important information for design purposes. The conductivities and loss information of nanoparticle inks and properties of dielectric material are achieved in addition to structural properties. In particular, dc measurement results from 1.1e7 S/m to 3.7e7 S/m and high-frequency attenuation values from 0.5 dB/cm to 2.8 dB/cm (at 10 GHz) are achieved for printed conductors.

Keywords

conductors (electric); dielectric materials; ink jet printing; DC measurement; dielectric material; electrical material properties; high-frequency attenuation; high-frequency material characterization; ink jet printing; nanoparticle inks; physical material properties; printable electronics; printed conductors; test structures; wideband material characterization methods; Attenuation measurement; Conducting materials; Conductivity; Dielectric losses; Dielectric materials; Ink; Material properties; Materials testing; Printing; Wideband; Ink jet printing; material characterization;

fLanguage

English

Journal_Title

Electronics Packaging Manufacturing, IEEE Transactions on

Publisher

ieee

ISSN

1521-334X

Type

jour

DOI

10.1109/TEPM.2010.2051809

Filename

5492288