DocumentCode
1522910
Title
Electrooptic imaging of surface electric fields in high-power photoconductive switches
Author
Kingsley, Lawrence E. ; Donaldson, William R.
Author_Institution
Lab. for Laser Energetics, Rochester Univ., NY, USA
Volume
37
Issue
12
fYear
1990
fDate
12/1/1990 12:00:00 AM
Firstpage
2449
Lastpage
2458
Abstract
A two-dimensional electrooptic probe was used to image the electric field in high-power photoconductive switches during switch operation. A LiTaO3 crystal, covering the entire active area of the photoconductive switch, coupled the surface electric field with the polarization of an optical probe pulse. The optical probe was imaged onto a two-dimensional detector array, producing snapshots of the surface field with 200-ps time resolution and 3-μm spatial resolution. The probe system was used to monitor the electric field in the electrode gap of high-voltage switches, the focus of investigation being the collapse of the electric field in a GaAs bulk switch as it was switched with a λ=1.06 μm optical pulse. The switching speed and generation of field enhancements were found to be dependent on the illumination configuration and the applied electric field, which varied from 0 to 15 kV/cm. Switching efficiency was found to decrease with increasing field
Keywords
III-V semiconductors; electro-optical devices; lithium compounds; photoconducting devices; probes; semiconductor switches; 1.06 micron; 200 ps; 3 micron; GaAs; LiTaO3 crystal; active area; bulk switch; electrode gap; high-power photoconductive switches; illumination configuration; optical probe pulse; spatial resolution; surface electric fields; switch operation; switching efficiency; switching speed; time resolution; two-dimensional detector array; two-dimensional electrooptic probe; Optical arrays; Optical coupling; Optical imaging; Optical polarization; Optical pulses; Optical switches; Photoconductivity; Probes; Sensor arrays; Spatial resolution;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.64517
Filename
64517
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