• DocumentCode
    1522910
  • Title

    Electrooptic imaging of surface electric fields in high-power photoconductive switches

  • Author

    Kingsley, Lawrence E. ; Donaldson, William R.

  • Author_Institution
    Lab. for Laser Energetics, Rochester Univ., NY, USA
  • Volume
    37
  • Issue
    12
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    2449
  • Lastpage
    2458
  • Abstract
    A two-dimensional electrooptic probe was used to image the electric field in high-power photoconductive switches during switch operation. A LiTaO3 crystal, covering the entire active area of the photoconductive switch, coupled the surface electric field with the polarization of an optical probe pulse. The optical probe was imaged onto a two-dimensional detector array, producing snapshots of the surface field with 200-ps time resolution and 3-μm spatial resolution. The probe system was used to monitor the electric field in the electrode gap of high-voltage switches, the focus of investigation being the collapse of the electric field in a GaAs bulk switch as it was switched with a λ=1.06 μm optical pulse. The switching speed and generation of field enhancements were found to be dependent on the illumination configuration and the applied electric field, which varied from 0 to 15 kV/cm. Switching efficiency was found to decrease with increasing field
  • Keywords
    III-V semiconductors; electro-optical devices; lithium compounds; photoconducting devices; probes; semiconductor switches; 1.06 micron; 200 ps; 3 micron; GaAs; LiTaO3 crystal; active area; bulk switch; electrode gap; high-power photoconductive switches; illumination configuration; optical probe pulse; spatial resolution; surface electric fields; switch operation; switching efficiency; switching speed; time resolution; two-dimensional detector array; two-dimensional electrooptic probe; Optical arrays; Optical coupling; Optical imaging; Optical polarization; Optical pulses; Optical switches; Photoconductivity; Probes; Sensor arrays; Spatial resolution;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.64517
  • Filename
    64517