• DocumentCode
    1522925
  • Title

    Performance of MDPSK, MPSK, and noncoherent MFSK in wireless Rician fading channels

  • Author

    Jonqyin, S. ; Reed, Irving S.

  • Author_Institution
    Lucent Technol., Whippany, NJ, USA
  • Volume
    47
  • Issue
    6
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    813
  • Lastpage
    816
  • Abstract
    Closed-form solutions for the average error rate of MDPSK, coherent MPSK, and noncoherent MFSK over slow, flat, Rician fading are derived. The solutions are sufficiently simple so that no approximations are needed for the numerical computations and general enough so that it includes AWGN and Rayleigh fading as special cases. Error probabilities are graphically displayed for various values of M. The dependence of error rate on the channel specular-to-scatter ratio are plotted and examined. Performance comparisons for a range of values of the Rician parameter K, corresponding to the measured statistics of mobile and indoor wireless channels, are made for the different digital modulation schemes. The analytical results presented in this paper are expected to provide information that is important for radio systems design and the evaluation of performance over a fading channel
  • Keywords
    AWGN channels; Rayleigh channels; Rician channels; differential phase shift keying; error statistics; frequency shift keying; indoor radio; land mobile radio; AWGN; MDPSK; MPSK; Rayleigh fading; average error rate; channel specular-to-scatter ratio; closed-form solutions; digital modulation schemes; error probabilities; indoor wireless channels; mobile wireless channel; noncoherent MFSK; performance; radio systems design; slow flat Rician fading; wireless Rician fading channels; AWGN; Closed-form solution; Digital modulation; Error analysis; Error probability; Information analysis; Performance analysis; Rayleigh channels; Rician channels; Statistics;
  • fLanguage
    English
  • Journal_Title
    Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0090-6778
  • Type

    jour

  • DOI
    10.1109/26.771335
  • Filename
    771335