Title :
Optical test set for microwave fiber-optic network analysis
Author :
Curtis, David D. ; Ames, Elizabeth E.
Author_Institution :
Rome Air Dev. Centre, Hanscom AFB, MA, USA
fDate :
5/1/1990 12:00:00 AM
Abstract :
Presented is an optical test set which can be used with any vector network analyzer for measuring microwave transmission and reflection scattering parameters of fiber-optic components. Measurement configurations and operating characteristics are discussed. Calibration of the network analyzer, which is performed using fiber-optic offset shorts, matched load, and thru-calibration standards, is discussed; reflection error terms are computed, and de-embedded relations are given for transmission and reflection measurements. A frequency-response normalization is presented as an alternative means of de-embedding reflection magnitude and phase. Accuracy limitations are addressed in terms of connector repeatability, calibration repeatability, accuracy of the calibration standards, test-set dynamic range, and resolution. S matrices measured at 2.0 GHz are presented to illustrate the utility of characterizing fiber-optic components in terms of microwave performance when designing a microwave fiber-optic network
Keywords :
calibration; microwave links; microwave measurement; optical communication equipment; optical fibres; optical links; optical workshop techniques; 2 GHz; S matrices; S-parameters; calibration repeatability; calibration standards; characterizing fiber-optic components; connector repeatability; fiber-optic matched load; fiber-optic offset shorts; frequency-response normalization; microwave fiber-optic network analysis; microwave performance; microwave scattering parameters measurement; operating characteristics; optical test set; reflection error terms; reflection measurements; test-set dynamic range; thru-calibration standards; vector network analyzer; Calibration; Measurement standards; Microwave measurements; Optical devices; Optical fiber networks; Optical fiber testing; Optical reflection; Optical scattering; Performance analysis; Scattering parameters;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on