FDTD analysis of submillimeter-wave CPW with finite-width ground metallization

Author

Huynh, Ngoc-Hoa ; Heinrich, Wolfgang

Author_Institution

Ferdinand-Braun-Inst. fur Hochstfrequenztechnik, Berlin, Germany

Volume

7

Issue

12

fYear

1997

fDate

12/1/1997 12:00:00 AM

Firstpage

414

Lastpage

416

Abstract

The dispersion and attenuation characteristics of conductor-backed coplanar transmission lines with finite-width ground metallizations are studied in the frequency range up to 1 THz. The finite-difference time-domain (FDTD) method is used for analysis. Open boundaries are described by means of Berenger´s perfectly matched layer. The results are compared to electrooptic measurements. They show that introducing ground metallizations of finite width causes distinct changes in attenuation and dispersion characteristics

Keywords

coplanar waveguides; finite difference time-domain analysis; metallisation; waveguide theory; 1 THz; Berenger perfectly matched layer; FDTD analysis; attenuation; conductor-backed coplanar transmission line; dispersion; electrooptic measurement; finite-width ground metallization; submillimeter-wave CPW; Attenuation; Coplanar transmission lines; Coplanar waveguides; Finite difference methods; Frequency; Metallization; Perfectly matched layers; Submillimeter wave propagation; Time domain analysis; Transmission line measurements;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.645193

Filename

645193