DocumentCode :
1523064
Title :
A 16 , \\times 16 Pixel Distance Sensor With In-Pixel Circuitry That Tolerates 150 klx of Ambient Light
Author :
Zach, Gerald ; Davidovic, Milos ; Zimmermann, Horst
Author_Institution :
Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
Volume :
45
Issue :
7
fYear :
2010
fDate :
7/1/2010 12:00:00 AM
Firstpage :
1345
Lastpage :
1353
Abstract :
A time-of-flight depth sensor is presented employing a correlation based concept. The pixels are able to suppress contributions of ambient light up to 150 klx autonomously and directly in the electronic circuits consuming only 2 μA, each. All 16 × 16 pixels capture the depth information simultaneously at maximally 16 frames per second using an external A/D converter (ADC). Additionally, an embedded 12-bit ADC can be used for converting the analog output values of the pixels to the digital domain at lower frame rates. Distance measurements in a range of 0-3.2 m show standard deviations in the centimeter range and a linearity error within -1/+2 cm. The influence of extraneous light is expressed as a relative distance error which is also in the centimeter range. A complete impression of the sensor system is given by discussing the pixel circuits, the ADC design, the design of the modulated light source providing 0.9 W optical power in the near infrared, and the auxiliary setup including an FPGA board. Additionally, a sensor model is provided to predict the measurement error due to stochastic sources. Three-dimensional snapshots as well as a comparison with state-of-the-art sensors and products complete the paper.
Keywords :
analogue-digital conversion; distance measurement; field programmable gate arrays; image sensors; ADC design; ambient light; digital domain; distance measurements; electronic circuits; external A-D converter; in-pixel circuitry; linearity error; optical power; pixel distance sensor; relative distance error; stochastic sources; time-of-flight depth sensor; Distance measurement; Electronic circuits; Infrared sensors; Light sources; Linearity; Measurement standards; Optical design; Optical modulation; Optical sensors; Sensor systems; 3D camera; ADC; correlation principle; integrated optoelectronics; mixed analog-digital integrated circuits; optical distance measurement; system on chip; time-of-flight;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2010.2048075
Filename :
5492315
Link To Document :
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