• DocumentCode
    1523213
  • Title

    Investigation of Sc2O3 behavior in Sc2 O3-dispersed oxide cathodes

  • Author

    Saito, Masato ; Suzuki, Ryo ; Fukuyama, Keiji ; Watanabe, Keiji ; Sano, Kinjiro ; Nakanishi, Hisano

  • Author_Institution
    Mitsubishi Electr. Corp., Kanagawa, Japan
  • Volume
    37
  • Issue
    12
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    2605
  • Lastpage
    2611
  • Abstract
    Sc2O3 behavior in oxide cathodes is investigated through the analyses of AES, XPS, and EPMA. It has been shown that Sc2O3 plays a significant role in maintaining higher surface concentration of Ba atoms. Thermochemical considerations have indicated possible reactions of Sc2O3 with interface compounds. It is concluded that Sc2O3 decomposes interface compounds and generates more Ba atoms in the vicinity of a base metal, and Sc2 O3 inside of an electron emissive layer also has an effect on reducing surface Ba evaporation and maintaining higher electric conductivity
  • Keywords
    Auger effect; X-ray photoelectron spectra; electron probe analysis; oxide coated cathodes; scandium compounds; surface chemistry; thermionic cathodes; AES; Ba atoms; EPMA; Sc2O3 behavior; Sc2O3-dispersed oxide cathodes; XPS; electric conductivity; electron emissive layer; interface compounds; surface Ba evaporation; surface concentration; thermochemistry; Atomic layer deposition; Brightness; Cathodes; Conductivity; Current density; Electrons; Powders; Spraying; Strontium; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.64548
  • Filename
    64548
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1523213