• DocumentCode
    1523285
  • Title

    Spin-Transfer Torque Switching Above Ambient Temperature

  • Author

    Hui Zhao ; Amiri, P.K. ; Yisong Zhang ; Lyle, A. ; Katine, J.A. ; Langer, J. ; Hongwen Jiang ; Wang, K.L. ; Krivorotov, I.N. ; Jian-Ping Wang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
  • Volume
    3
  • fYear
    2012
  • fDate
    7/4/1905 12:00:00 AM
  • Firstpage
    3000304
  • Lastpage
    3000304
  • Abstract
    We report the temperature dependences of tunneling magnetoresistance ratio, coercivity, thermal stability, and switching current distribution of magnetic tunnel junctions (MTJs) in the temperature range 25-80°C, the most probable working environment for spin-transfer torque random access memory (STT-RAM). Two distinct temperature dependence of the switching current density are apparent due to two switching mechanisms: a switching current density decrease with increasing temperature in the long-pulse ( >; 1 μs) regime, a result of thermally activated switching, but no decrease in the short-pulse (>;10 ns) regime, as a result of precessional switching. In the temperature range studied, the switching current density variation is less sensitive to environmental temperature than it is to switching time. Thus, switching time is the more important factor to consider in STT-RAM design.
  • Keywords
    coercive force; current density; magnetic switching; random-access storage; thermal stability; tunnelling magnetoresistance; MTJ; STT-RAM; ambient temperature; coercivity; environmental temperature; long-pulse regime; magnetic tunnel junctions; precessional switching; short-pulse regime; spin-transfer torque random access memory; spin-transfer torque switching; switching current density; switching current distribution; temperature 25 degC to 80 degC; temperature dependences; thermal stability; thermally activated switching; tunneling magnetoresistance; working environment; Current density; Magnetic tunneling; Switches; Temperature dependence; Temperature distribution; Temperature measurement; Thermal stability; Spin electronics; magnetic tunnel junction (MTJ); spin-transfer torque random access memory (STT-RAM); spin-transfer torque switching;
  • fLanguage
    English
  • Journal_Title
    Magnetics Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1949-307X
  • Type

    jour

  • DOI
    10.1109/LMAG.2012.2195775
  • Filename
    6204220