DocumentCode
1523522
Title
Interferometer profile extraction using continuous wavelet transform
Author
Watkins, L.R. ; Tan, S.M. ; Barnes, T.H.
Author_Institution
Dept. of Phys., Auckland Univ.
Volume
33
Issue
25
fYear
1997
fDate
12/4/1997 12:00:00 AM
Firstpage
2116
Lastpage
2117
Abstract
The continuous wavelet transform may be used to accurately reconstruct surface profiles from two sets of Fizeau interferometer fringe data. In contrast to standard phase-stepping methods, the data may have any arbitrary phase-step between 0 and π. The method enables considerable simplification of the measurment apparatus and yields accurate profiles, even in the presence of noise
Keywords
light interferometry; measurement by laser beam; surface topography measurement; wavelet transforms; Fizeau interferometer fringe data; continuous wavelet transform; interferometer profile extraction; measurment apparatus simplification; surface profile reconstruction;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19971474
Filename
645735
Link To Document