DocumentCode :
1523650
Title :
Approximate bit error probability analysis of 2PSK and 4PSK with partially coherent, symbol-by-symbol detection in carrier phase noise
Author :
Kam, P.Y. ; Some, Y.K.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Volume :
146
Issue :
2
fYear :
1999
fDate :
4/1/1999 12:00:00 AM
Firstpage :
120
Lastpage :
126
Abstract :
The effect of carrier phase noise on the BEP of 2PSK and 4PSK with partially coherent, symbol-by-symbol detection is analysed using an approximate approach. Partially coherent detection is achieved using a decision-aided, maximum likelihood carrier phase estimator. The carrier phase noise is modelled as a Brownian motion. Assuming a small phase noise variance, it is shown that the Brownian phase noise, together with the additive, white, Gaussian channel noise, leads to a Gaussian phase error in the recovered reference and a random signal component for data detection. These results enable the BEP to be numerically evaluated, and the numerical results agree well with the results of computer simulations. Both the effects of carrier phase fluctuations on the matched filter output and the decorrelation of the carrier phase from one symbol interval to the next are taken into account
Keywords :
AWGN; Brownian motion; decorrelation; error statistics; filtering theory; matched filters; maximum likelihood detection; maximum likelihood estimation; phase estimation; phase noise; phase shift keying; 2PSK; 4PSK; BEP; Brownian motion; Brownian phase noise; Gaussian phase error; additive white Gaussian channel noise; approximate bit error probability analysis; carrier phase fluctuations; carrier phase noise; computer simulations; data detection; decision-aided phase estimator; decorrelation; matched filter output; maximum likelihood carrier phase estimator; partially coherent detection; random signal component; recovered reference; small phase noise variance; symbol interval;
fLanguage :
English
Journal_Title :
Communications, IEE Proceedings-
Publisher :
iet
ISSN :
1350-2425
Type :
jour
DOI :
10.1049/ip-com:19990109
Filename :
771470
Link To Document :
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