Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors

Presented is a new test method that consists in monitoring on-chip internal voltages during susceptibility tests of integrated circuits. An on-chip sensor was installed at several internal nodes within low-dropout regulators to measure the distortion of internal signals induced by the coupling of electromagnetic interference. The comparison between external and internal measurement results shows that on-chip sensor techniques enhance the extraction of circuit susceptibility levels, especially at high frequencies.