Title : 
Generation of Equivalent-Circuit Models From Simulation Data of a Thermal System
         
        
            Author : 
Karagol, Serap ; Bikdash, Marwan
         
        
            Author_Institution : 
Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
         
        
        
        
        
            fDate : 
4/1/2010 12:00:00 AM
         
        
        
        
            Abstract : 
In this paper, we develop a methodology to obtain medium-order electrical equivalent circuits (ECs) of the thermal behavior of electronic systems. The method combines several elements: 1) the use of detailed finite-element (FE) simulations of steady-state thermal behavior; 2) graph partitioning of FE meshes to decompose the geometry at intermediate levels of detail; and 3) physically guided estimation of the parameters of the EC. To obtain richer training datasets, we also develop a method to include fictitious heat sources inside the FE model. This approach yields modular medium-order models for extensive and complicated geometries, such as a power-electronic chip. Moreover, representing the thermal behavior with an EC enables coupled simulations of electrothermal behavior, which are important in power electronics. We test our algorithms on a multimaterial pole of a dc motor and electronic chip. Excellent agreement in modeling both steady-state and transient behaviors was obtained.
         
        
            Keywords : 
equivalent circuits; finite element analysis; power electronics; electronic chip; electronic systems; electrothermal behavior; finite element model; finite element simulations; graph partitioning; heat sources; medium order electrical equivalent circuit model; modular medium order models; power electronics; simulation data; steady state thermal behavior; thermal system; transient behaviors; Equivalent circuits, heat transfer, power electronics, reduced-order modeling, system identification;
         
        
        
            Journal_Title : 
Power Electronics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TPEL.2009.2035317