Title :
Outage probability of two-way opportunistic amplify-and-forward relaying
Author :
Guo, Hongyu ; Ge, J.H.
Author_Institution :
State Key Lab. of Integrated Service Networks, Xidian Univ., Xi´an, China
Abstract :
The exact outage probability expression of two-way opportunistic relaying systems in amplify-and-forward strategy is presented, and a tight closed-form lower bound is obtained too. Simulation results are in excellent agreement with the derived expression and show that the signal-to-noise ratio gap between the lower bound and the actual performance is less than 1 dB.
Keywords :
fading channels; probability; outage probability expression; tight closed-form lower bound; two-way opportunistic amplify-and-forward relaying;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.1315
