• DocumentCode
    1523913
  • Title

    A spectroscopic detecting system for measuring the temperature distribution of silver breaking arc using a CCD color camera

  • Author

    Takeuchi, Mitsuru ; Kubono, Takayoshi

  • Author_Institution
    Nagoya Municipal Ind. Res. Inst., Japan
  • Volume
    48
  • Issue
    3
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    678
  • Lastpage
    683
  • Abstract
    This paper describes a spectroscopic detecting system that utilizes a CCD color camera to observe the distributions of two spectral intensities along the axis of an arc column. Following this, the distributions of Ag I 421 nm and Ag I 547 mm spectra observed along the axis of an arc column and the arc temperature calculated from the two spectra when silver contacts interrupt a circuit of dc 50 V and 3.3 A are presented. The spectral intensities of excited silver atoms are strongest near the cathode and become weaker with distance from the cathode contact. The temperature in the cross section of an arc column is highest in the axis of the arc column. The temperature along the axis of arc column is highest near the cathode and becomes weaker with distance from the cathode. Furthermore, in this study it is clarified that CN band spectra exist near the anode contact
  • Keywords
    CCD image sensors; arcs (electric); circuit-breaking arcs; electrical contacts; high-temperature techniques; silver; spectral methods of temperature measurement; temperature distribution; visible spectra; visible spectroscopy; 3.3 A; 421 nm; 50 V; 547 nm; Ag; Ag I spectra; CCD color camera; CN band spectra; anode contact; arc column axis; arc discharges; arc temperature; breaking arc; spectral intensities distribution; spectroscopic detecting system; temperature distribution measurement; Anodes; Cathodes; Charge coupled devices; Charge-coupled image sensors; Circuits; Contacts; Silver; Spectroscopy; Temperature distribution; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.772195
  • Filename
    772195