Automated system for noise-measurements on low-ohmic samples and magnetic sensors

Author

Jonker, R.J.W. ; Briaire, J. ; Vandamme, L.K.J.

Author_Institution

Eindhoven Univ. of Technol., Netherlands

Volume

48

Issue

3

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

730

Lastpage

735

Abstract

An automated system for electronic noise measurements on metal films is presented. This new system, controlled by a personal computer which utilizes National Instruments´ LabVIEW software, is designed to measure low frequency noise as a function of an externally imposed magnetic field and as a function of a dc bias current in low-ohmic samples and magnetic sensors. With this system we are able to measure continuously for several days, during which the measured spectra are collected, processed and stored for further analysis

Keywords

1/f noise; automatic test equipment; bridge circuits; digital control; electric noise measurement; magnetic sensors; metallic thin films; preamplifiers; ATE; DC bias current; LabVIEW software; Wheatstone bridge; automated system; digital control; electronic noise measurements; externally imposed magnetic field; low frequency noise; low-ohmic samples; magnetic sensor; magnetoresistors; metal films; personal computer controlled; ultralow-noise amplifier; Control systems; Instruments; Low-frequency noise; Magnetic field measurement; Magnetic films; Magnetic noise; Magnetic sensors; Microcomputers; Noise measurement; Software design;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.772210

Filename

772210