DocumentCode
1524169
Title
Soft errors in advanced semiconductor devices-part I: the three radiation sources
Author
Baumann, Robert C.
Author_Institution
Silicon Technol. Dev. Group, Texas Instrum. Inc., Dallas, TX, USA
Volume
1
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
17
Lastpage
22
Abstract
In this review paper, we summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in semiconductor devices and discuss methods useful for reducing the impact of the effects in final packaged parts
Keywords
integrated circuit packaging; integrated circuit reliability; radiation effects; advanced semiconductor devices; distinguishing characteristics; final packaged parts; primary radiation mechanisms; radiation sources; soft errors; Alpha particles; Energy states; Ionization; Ionizing radiation; Isotopes; Neutrons; Packaging; Radioactive materials; Random access memory; Semiconductor devices;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/7298.946456
Filename
946456
Link To Document