DocumentCode
1524284
Title
The unusual electrical erosion of high tungsten content, tungsten copper contacts switching load current in vacuum
Author
Slade, Paul G. ; Li, Wangpei ; Loud, Leslie D. ; Haskins, Richard E., Jr.
Author_Institution
Cutler-Hammer Inc., Horseheads, NY, USA
Volume
24
Issue
3
fYear
2001
fDate
9/1/2001 12:00:00 AM
Firstpage
320
Lastpage
330
Abstract
The electrical erosion of high tungsten content, tungsten-copper (7-10 wt.% Cu) was investigated. The contacts were placed in a vacuum interrupter envelope with a background pressure of about 10-6 torr. The contacts switched one half cycle of 60 Hz current per operation. The polarity of the current was changed on each operation. Six contact pairs were investigated. Each pair was subjected to an ever-increasing number of operations: 1 K, 5 K, 10 K, 20 K, 40 K, 50 K, and 60 K. The contact erosion was inferred by measuring the linear position of the moving contact terminal. On completing the electrical testing, the vacuum interrupters were dismantled and the contact surfaces were observed. Unlike the previous work on Ag-WC (50 wt.% Ag) and Cu-Cr (75 wt.% Cu), the W-Cu contacts showed a localized build up of erosion products on the contact surfaces even beginning at 1 K operations. The experiments were repeated switching a unidirectional current i.e., the contacts remained at the same polarity throughout the experiments. Here an anode pip and a cathode crater were formed immediately. The difference in the topographies of these contacts is discussed in terms of the metallographic analysis of the deposits on the contacts, the erosion deposits on the shields surrounding the contacts and the expansion of the vacuum arc
Keywords
circuit-breaking arcs; copper alloys; electrical contacts; switchgear testing; tungsten alloys; vacuum interrupters; wear testing; 1E-6 torr; 60 Hz; WCu; anode pip; background pressure; cathode crater; contact pairs; contact surfaces; electrical erosion; linear position; load current; metallographic analysis; moving contact terminal; unidirectional current; vacuum interrupter envelope; Anodes; Cathodes; Circuits; Contacts; Copper; Interrupters; Manufacturing; Surface topography; Tungsten; Vacuum arcs;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/6144.946474
Filename
946474
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