• DocumentCode
    1524291
  • Title

    Arc root commutation from moving contacts in low voltage devices

  • Author

    McBride, John W. ; Pechrach, Kesorn ; Weaver, Paul M.

  • Author_Institution
    Sch. of Eng. Sci., Southampton Univ., UK
  • Volume
    24
  • Issue
    3
  • fYear
    2001
  • fDate
    9/1/2001 12:00:00 AM
  • Firstpage
    331
  • Lastpage
    336
  • Abstract
    This paper focus on the arc commutation from a moving contact and in particular on the anode motion of a high current arc in low voltage current limiting circuit breakers. Recent investigations have observed that the anode arc root motion is affected by arc chamber geometry. It was previously assumed that cathode root motion was the dominant process. The study uses a flexible test apparatus with a solid state high speed imaging system. The experimental results presented show the influence of arc chamber venting, current level, current polarity and contact velocity on arc motion, Particular emphasis is made on the anode motion. The physical processes occurring in the anode root are discussed and related to the observed motion. The results show that the anode root is retarded at the tip of the moving contact and that this is primarily related to the venting process in the arc chamber
  • Keywords
    circuit breakers; circuit-breaking arcs; commutation; electrical contacts; anode motion; arc chamber geometry; arc root commutation; cathode root motion; chamber venting; contact velocity; current level; current limiting circuit breakers; current polarity; high current arc; low voltage devices; moving contacts; solid state high speed imaging system; Anodes; Cathodes; Circuit breakers; Circuit faults; Circuit testing; Current limiters; Geometry; Low voltage; Solid state circuits; System testing;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/6144.946475
  • Filename
    946475