DocumentCode
1524292
Title
The method of lines for the analysis of planar waveguides with finite metallization thickness
Author
Schmückle, Franz J. ; Pregla, Reinhold
Author_Institution
Fachbereich Elektrotech., Fern Univ., Hagen, Germany
Volume
39
Issue
1
fYear
1991
fDate
1/1/1991 12:00:00 AM
Firstpage
107
Lastpage
111
Abstract
The method of lines is extended to calculate waveguide structures with finite metallization thickness. The normally used range of metallization thickness is not a limit for the method. Particularly when calculating small or moderate thicknesses, it is possible to derive the dispersion constant with only one computed result. When using the optimal edge parameter, P opt, for that computation, the deviation from the exact dispersion constant is less than 0.5%. The advantage of the method of lines is that only small line numbers are necessary. Hence, the computing time is very small
Keywords
waveguide theory; analysis of planar waveguides; computing time; dispersion constant; finite metallization thickness; method of lines; optimal edge parameter; range of metallization thickness; small line numbers; Circuits; Dielectrics; Electromagnetic waveguides; Finline; Maxwell equations; Metallization; Microstrip; Planar waveguides; Transforms; Transmission line matrix methods;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.64612
Filename
64612
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