• DocumentCode
    1524292
  • Title

    The method of lines for the analysis of planar waveguides with finite metallization thickness

  • Author

    Schmückle, Franz J. ; Pregla, Reinhold

  • Author_Institution
    Fachbereich Elektrotech., Fern Univ., Hagen, Germany
  • Volume
    39
  • Issue
    1
  • fYear
    1991
  • fDate
    1/1/1991 12:00:00 AM
  • Firstpage
    107
  • Lastpage
    111
  • Abstract
    The method of lines is extended to calculate waveguide structures with finite metallization thickness. The normally used range of metallization thickness is not a limit for the method. Particularly when calculating small or moderate thicknesses, it is possible to derive the dispersion constant with only one computed result. When using the optimal edge parameter, Popt, for that computation, the deviation from the exact dispersion constant is less than 0.5%. The advantage of the method of lines is that only small line numbers are necessary. Hence, the computing time is very small
  • Keywords
    waveguide theory; analysis of planar waveguides; computing time; dispersion constant; finite metallization thickness; method of lines; optimal edge parameter; range of metallization thickness; small line numbers; Circuits; Dielectrics; Electromagnetic waveguides; Finline; Maxwell equations; Metallization; Microstrip; Planar waveguides; Transforms; Transmission line matrix methods;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.64612
  • Filename
    64612