DocumentCode :
1524292
Title :
The method of lines for the analysis of planar waveguides with finite metallization thickness
Author :
Schmückle, Franz J. ; Pregla, Reinhold
Author_Institution :
Fachbereich Elektrotech., Fern Univ., Hagen, Germany
Volume :
39
Issue :
1
fYear :
1991
fDate :
1/1/1991 12:00:00 AM
Firstpage :
107
Lastpage :
111
Abstract :
The method of lines is extended to calculate waveguide structures with finite metallization thickness. The normally used range of metallization thickness is not a limit for the method. Particularly when calculating small or moderate thicknesses, it is possible to derive the dispersion constant with only one computed result. When using the optimal edge parameter, Popt, for that computation, the deviation from the exact dispersion constant is less than 0.5%. The advantage of the method of lines is that only small line numbers are necessary. Hence, the computing time is very small
Keywords :
waveguide theory; analysis of planar waveguides; computing time; dispersion constant; finite metallization thickness; method of lines; optimal edge parameter; range of metallization thickness; small line numbers; Circuits; Dielectrics; Electromagnetic waveguides; Finline; Maxwell equations; Metallization; Microstrip; Planar waveguides; Transforms; Transmission line matrix methods;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.64612
Filename :
64612
Link To Document :
بازگشت