• DocumentCode
    1524532
  • Title

    The Thermal Resistance of Solder Joints in High Brightness Light Emitting Diode (HB LED) Packages

  • Author

    Yoon, Young-Bok ; Park, Jin-Woo

  • Author_Institution
    Comput.-Aided Eng. Group, Samsung Electro-Mech. Co. Ltd., Suwon, South Korea
  • Volume
    32
  • Issue
    4
  • fYear
    2009
  • Firstpage
    825
  • Lastpage
    831
  • Abstract
    We present a framework to calculate the thermal resistance of Au-Sn eutectic solder joint (Rth, Au-Sn joint) in high brightness light emitting diode (HB LED) packages whose heat extraction capability controls the optical efficiency and reliability of HB LEDs. Using the transient thermal measurement combined with the structure function based analytical method and the finite element method, we find that the thermal conductivity (k) of the thin solder joint becomes significantly smaller than the Au-Sn alloy after joining; hence, Rth, Au-Sn joint constitutes a large portion of the total Rth of the package (Rth PKG).
  • Keywords
    brightness; electronics packaging; finite element analysis; light emitting diodes; semiconductor device reliability; solders; thermal conductivity; HB LEDs; finite element method; heat extraction; high brightness light emitting diode packages; optical efficiency; reliability; solder joints; thermal conductivity; thermal resistance; transient thermal measurement; Finite element method; LED package; structure function; thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2009.2033414
  • Filename
    5299257