DocumentCode
1524532
Title
The Thermal Resistance of Solder Joints in High Brightness Light Emitting Diode (HB LED) Packages
Author
Yoon, Young-Bok ; Park, Jin-Woo
Author_Institution
Comput.-Aided Eng. Group, Samsung Electro-Mech. Co. Ltd., Suwon, South Korea
Volume
32
Issue
4
fYear
2009
Firstpage
825
Lastpage
831
Abstract
We present a framework to calculate the thermal resistance of Au-Sn eutectic solder joint (Rth, Au-Sn joint) in high brightness light emitting diode (HB LED) packages whose heat extraction capability controls the optical efficiency and reliability of HB LEDs. Using the transient thermal measurement combined with the structure function based analytical method and the finite element method, we find that the thermal conductivity (k) of the thin solder joint becomes significantly smaller than the Au-Sn alloy after joining; hence, Rth, Au-Sn joint constitutes a large portion of the total Rth of the package (Rth PKG).
Keywords
brightness; electronics packaging; finite element analysis; light emitting diodes; semiconductor device reliability; solders; thermal conductivity; HB LEDs; finite element method; heat extraction; high brightness light emitting diode packages; optical efficiency; reliability; solder joints; thermal conductivity; thermal resistance; transient thermal measurement; Finite element method; LED package; structure function; thermal resistance;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/TCAPT.2009.2033414
Filename
5299257
Link To Document