• DocumentCode
    1524540
  • Title

    Dielectric breakdown strength correlation with time-to-failure during wet aging of XLPE-insulated cables

  • Author

    Walton, Mark D. ; Bernstein, Bruce S. ; Thue, William A. ; Smith, John T., III

  • Author_Institution
    BICC Cables Ltd., Wrexham, UK
  • Volume
    14
  • Issue
    3
  • fYear
    1999
  • fDate
    7/1/1999 12:00:00 AM
  • Firstpage
    750
  • Lastpage
    755
  • Abstract
    This paper reviews two sets of failure information, the GMTF (a parameter obtained from time-to-failure results) and GMBD stress (a parameter that is calculated from AC breakdown test results), and suggests a correlation. The test results were obtained from accelerated aging experiments on full-sized medium voltage cables in carefully controlled and monitored water-filled tanks. Results show that the ambient temperature AC breakdown strength for equivalently aged cables is influenced primarily by voltage stress during aging-not by the aging temperature. The AC breakdown strength on equivalently aged cables was also shown to decrease with reductions in the aging voltage at all aging temperatures
  • Keywords
    XLPE insulation; ageing; electric breakdown; electric strength; failure analysis; insulation testing; power cable insulation; power cable testing; AC breakdown test; XLPE-insulated cables; accelerated aging; aging temperatures; aging voltage; ambient temperature AC breakdown strength; dielectric breakdown strength correlation; equivalently aged cables; failure information; full-sized medium voltage cables; geometric mean breakdown; geometric mean time-to-failure; voltage stress; water-filled tanks; wet aging; Accelerated aging; Breakdown voltage; Cables; Dielectric breakdown; Electric breakdown; Medium voltage; Stress; Temperature; Testing; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/61.772310
  • Filename
    772310