• DocumentCode
    1525168
  • Title

    Space charge measurements in polymeric HV insulation materials

  • Author

    Wu, X. ; Chen, G. ; Davies, A.E. ; Hampton, R.N. ; Sutton, S.J. ; Swingler, S.G.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • Volume
    8
  • Issue
    4
  • fYear
    2001
  • fDate
    8/1/2001 12:00:00 AM
  • Firstpage
    725
  • Lastpage
    730
  • Abstract
    This paper reports on a study using the laser induced pressure propagation (LIPP) method to measure the space charge characteristics in bulk crosslinked polyethylene (XLPE) insulation under dc electric stress. Particular attention has been given to the quantitative appraisal of calibration parameters, and the resultant estimations of space charge and electric stress distributions. A method is described for analyzing the measured raw data from ramp voltage and aging tests to give an estimate of charge and stress without resorting to a complicated mathematical exercise. The consequence of stress enhancement due to the trapped charge on the life of the insulation is estimated using the empirical inverse law. Using analysis of variance and a multivariate analysis technique, the effects of treatment and type of XLPE on the space charge characteristics are also discussed
  • Keywords
    XLPE insulation; ageing; charge measurement; dielectric measurement; insulation testing; measurement by laser beam; space charge; XLPE; aging; bulk crosslinked polyethylene; calibration; electric stress distribution; insulation life; inverse law; laser induced pressure propagation method; multivariate analysis; polymeric HV insulation material; ramp voltage testing; space charge measurement; variance analysis; Analysis of variance; Charge measurement; Current measurement; Electric variables measurement; Optical materials; Optical propagation; Plastic insulation; Polymers; Space charge; Stress measurement;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.946730
  • Filename
    946730