Title :
An 0.18-μm CMOS for mixed digital and analog applications with zero-volt-Vth epitaxial-channel MOSFETs
Author :
Ohguro, Tatsuya ; Naruse, Hiroshi ; Sugaya, Hiroyuki ; Morifuji, Eiji ; Nakamura, Sinichi ; Yoshitomi, Takashi ; Morimoto, Toyota ; Kimijima, Hideki ; Momose, Hisayo Sasaki ; Katsumata, Yasuhiro ; Iwai, Hiroshi
Author_Institution :
Toshiba Corp., Yokohama, Japan
fDate :
7/1/1999 12:00:00 AM
Abstract :
An 0.18-μm CMOS technology with multi-Vths for mixed high-speed digital and RF-analog applications has been developed. The V ths of MOSFETs for digital circuits are 0.4 V for NMOS and -0.4 V for PMOS, respectively. In addition, there are n-MOSFET´s with zero-volt-Vth for RF analog circuits. The zero-volt-Vth MOSFETs were made by using undoped epitaxial layer for the channel regions. Though the epitaxial film was grown by reduced pressure chemical vapor deposition (RP-CVD) at 750°C, the film quality is as good as the bulk silicon because high pre-heating temperature (940°C for 30 s) is used in H2 atmosphere before the epitaxial growth. The epitaxial channel MOSFET shows higher peak gm and fT values than those of bulk cases. Furthermore, the gm and fT values of the epitaxial channel MOSFET show significantly improved performances under the lower supply voltage compared with those of bulk. This is very important for RF analog application for low supply voltage. The undoped-epitaxial-channel MOSFETs with zero-Vth will become a key to realize high-performance and low-power CMOS devices for mixed digital and RF-analog applications
Keywords :
CMOS integrated circuits; MOSFET; low-power electronics; mixed analogue-digital integrated circuits; semiconductor growth; vapour phase epitaxial growth; -0.4 V; 0.18 micron; 0.4 V; 30 s; 750 degC; 940 degC; CMOS; RF-analog applications; channel regions; mixed digital/analog circuits; pre-heating temperature; reduced pressure chemical vapor deposition; supply voltage; undoped epitaxial layer; zero-volt-Vth epitaxial-channel MOSFET; Analog circuits; CMOS technology; Chemical vapor deposition; Digital circuits; Epitaxial layers; MOS devices; MOSFET circuits; Radio frequency; Semiconductor films; Silicon;
Journal_Title :
Electron Devices, IEEE Transactions on