• DocumentCode
    1525414
  • Title

    Analytical current-voltage relations for compact SiGe HBT models. I. The “idealized” HBT

  • Author

    Friedrich, Martin ; Rein, Hans-Martin

  • Author_Institution
    Ruhr-Univ., Bochum, Germany
  • Volume
    46
  • Issue
    7
  • fYear
    1999
  • fDate
    7/1/1999 12:00:00 AM
  • Firstpage
    1384
  • Lastpage
    1393
  • Abstract
    Based on the generalized integral charge control relation (GICCR), analytical current-voltage relations for “true” SiGe heterojunction bipolar transistors (HBTs) are derived, which are well suited for compact physically based transistor models. For this, the weighted minority charge in the collector, which proved to be of dominating influence at high current densities, is calculated from simple physical expressions. They contain the operating point as well as physical and technological parameters. The model equations, which serve as a basis for a new physically based compact SiGe HBT model called SIGEM, are verified up to high current densities by numerical device simulations. It is shown that not only the static behavior but also the small-signal parameters y21 and y22, which are more sensitive to potential model errors, are well described even far within the high-current region. In this first part of the paper, the work is restricted to HBTs with idealized and simplified doping profile. In the second part [2] it is shown how these equations can also he applied to HBTs with modified, more practical doping profiles and how the model parameters can be extracted
  • Keywords
    Ge-Si alloys; doping profiles; heterojunction bipolar transistors; semiconductor device models; semiconductor materials; HBT; SIGEM; SiGe; analytical current-voltage relations; doping profile; generalized integral charge control relation; idealized devices; model errors; model parameters; operating point; physically based transistor models; small-signal parameters; static behavior; weighted minority charge; Bipolar transistors; Current density; Doping profiles; Equations; Frequency; Germanium silicon alloys; Heterojunction bipolar transistors; Numerical simulation; Semiconductor process modeling; Silicon germanium;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.772480
  • Filename
    772480