Title :
Collector-up SiGe heterojunction bipolar transistors
Author :
Gruhle, Andreas ; Kibbel, Horst ; Mähner, Claus ; Mroczek, Werner
Author_Institution :
Res. Center, Daimler-Benz AG, Ulm, Germany
fDate :
7/1/1999 12:00:00 AM
Abstract :
SiGe heterojunction bipolar transistors (HBTs) in a collector-up version have been built. This configuration has the advantage of a very low collector-base capacitance. In addition, because the substrate is the emitter, extremely low emitter series inductances may be achieved, e.g., in the case of packaged discrete devices. This is particularly interesting for RF power amplifiers. Transistors fabricated on MBE-grown layers with an emitter size of 1.6 μm showed near-ideal Gummel plots, DC current gains of up to 485, an S21 gain of 20 dB at 2 GHz and an fmax of 33 GHz. A problem to be solved is the large parasitic CBE capacitance which degrades the transit frequency
Keywords :
Ge-Si alloys; UHF bipolar transistors; capacitance; heterojunction bipolar transistors; inductance; microwave bipolar transistors; semiconductor materials; 1.6 micron; 2 GHz; 20 dB; 33 GHz; DC current gain; MBE-grown layers; RF power amplifiers; SiGe; SiGe heterojunction bipolar transistors; collector-up HBT; low collector-base capacitance; low emitter series inductances; near-ideal Gummel plots; packaged discrete devices; parasitic CBE capacitance; transit frequency degradation; Degradation; Gain; Germanium silicon alloys; Heterojunction bipolar transistors; Packaging; Parasitic capacitance; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Silicon germanium;
Journal_Title :
Electron Devices, IEEE Transactions on