Title :
A broadband, on-chip sub/millimeter-wave spectrometer for X-Spec on CCAT
Author :
Hailey-Dunsheath, S. ; Bradford, C.M. ; Shirokoff, E. ; Hollister, M. ; McKenney, C. ; Chapman, S.C. ; Tikomirov, A. ; Nikola, T.
Author_Institution :
California Inst. of Technol., Pasadena, CA, USA
Abstract :
X-Spec is a moderate-resolution (R=400-700), multi-beam survey spectrometer covering the 190-520 GHz band under development for CCAT. It will employ a superconducting lithographically-patterned on-chip spectrometer technology, called SuperSpec. The spectrometer employs a filterbank architecture, and consists of a series of half-wave resonators formed by lithographically-patterned superconducting transmission lines. The signal power admitted by each resonator is detected by a lumped element TiN KID operating at 100-200 MHz. We have fabricated and characterized devices operating at 180-280 GHz, and will provide an update on our latest results.
Keywords :
millimetre wave spectroscopy; submillimetre wave spectroscopy; superconducting cavity resonators; superconducting transmission lines; titanium compounds; CCAT; SuperSpec; TiN; X-Spec; broadband on-chip sub/millimeter-wave spectrometer; filterbank architecture; frequency 100 MHz to 200 MHz; frequency 190 GHz to 520 GHz; half-wave resonators; lithographically-patterned superconducting transmission lines; lumped element TiN KID; moderate-resolution multibeam survey spectrometer; signal power; superconducting lithographically-patterned on-chip spectrometer technology; Detectors; Optical filters; Optical resonators; Optical waveguides; Superconducting filters; Superconducting transmission lines; Tin;
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on
Conference_Location :
Tucson, AZ
DOI :
10.1109/IRMMW-THz.2014.6956002
