DocumentCode :
1525987
Title :
Energy-Optimal Dynamic Thermal Management: Computation and Cooling Power Co-Optimization
Author :
Shin, Donghwa ; Chung, Sung Woo ; Chung, Eui-Young ; Chang, Naehyuck
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Volume :
6
Issue :
3
fYear :
2010
Firstpage :
340
Lastpage :
351
Abstract :
Conventional dynamic thermal management (DTM) assumes that the thermal resistance of a heat-sink is a given constant determined at design time. However, the thermal resistance of a common forced-convection heat sink is inversely proportional to the flow rate of the air or coolant at the expense of the cooling power consumption. The die temperature of the silicon devices strongly affects its leakage power consumption and reliability, and it can be changed by adjusting the thermal resistance of the cooling devices. Different from conventional DTM which aims to avoid the thermal emergency, our proposed DTM regards the thermal resistance of a forced-convection heat sink as a control variable, and minimize the total power consumption both for computation and cooling. We control the cooling power consumption together with the microprocessor clock frequency and supply voltage, and track the energy-optimal die temperature. Consequently, we reduce a significant amount of the temperature-dependent leakage power consumption of the microprocessor while spending a bit higher cooling power than conventional DTM, and eventually consume less total power. Experimental results show the proposed DTM saves up to 8.2% of the total energy compared with a baseline DTM approach. Our proposed DTM also enhances the Failures in Time (FIT) up to 80% in terms of the electromigration lifetime reliability.
Keywords :
convection; electromigration; heat sinks; microprocessor chips; thermal management (packaging); thermal resistance; cooling power co-optimization; electromigration lifetime reliability; energy optimal dynamic thermal management; forced convection heat sink; heat sink thermal resistance; microprocessor; temperature dependent leakage power consumption; Dynamic thermal management (DTM); heat sink; liquid cooling; reliability; temperature-dependent leakage power;
fLanguage :
English
Journal_Title :
Industrial Informatics, IEEE Transactions on
Publisher :
ieee
ISSN :
1551-3203
Type :
jour
DOI :
10.1109/TII.2010.2052059
Filename :
5497141
Link To Document :
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