• DocumentCode
    1526035
  • Title

    Coherent X-Ray Diffraction Imaging

  • Author

    Miao, Jianwei ; Sandberg, Richard L. ; Song, Changyong

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of California, Los Angeles, CA, USA
  • Volume
    18
  • Issue
    1
  • fYear
    2012
  • Firstpage
    399
  • Lastpage
    410
  • Abstract
    For centuries, lens-based microscopy, such as optical, phase-contrast, fluorescence, confocal, and electron microscopy, has played an important role in the evolution of modern science and technology. In 1999, a novel form of microscopy, i.e., coherent diffraction imaging (also termed coherent diffraction microscopy or lensless imaging), was developed and transformed our conventional view of microscopy, in which the diffraction pattern of a noncrystalline specimen or a nanocrystal was first measured and then directly phased to obtain a high-resolution image. The well-known phase problem was solved by combining the oversampling method with iterative algorithms. In this paper, we will briefly discuss the principle of coherent diffraction imaging, present various implementation schemes of this imaging modality, and illustrate its broad applications in materials science, nanoscience, and biology. As coherent X-ray sources such as high harmonic generation and X-ray free-electron lasers are presently under rapid development worldwide, coherent diffraction imaging can potentially be applied to perform high-resolution imaging of materials/nanoscience and biological specimens at the femtosecond time scale.
  • Keywords
    X-ray diffraction; X-ray imaging; X-ray optics; free electron lasers; light coherence; optical harmonic generation; synchrotron radiation; X-ray free-electron lasers; X-ray sources; coherent X-ray diffraction imaging; coherent diffraction imaging; coherent diffraction microscopy; high harmonic generation; iterative algorithms; lensless imaging; oversampling method; synchrotron radiation; Diffraction; Image resolution; Imaging; Nanocrystals; Three dimensional displays; X-ray diffraction; X-rays; Ankylography; X-ray free-electron lasers (XFEL); coherent diffraction imaging (CDI); equally sloped tomography (EST); high harmonic generation (HHG); lensless imaging; oversampling; phase retrieval;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2011.2157306
  • Filename
    5773472