• DocumentCode
    1526278
  • Title

    Photo-Annealing Effects on Gamma Radiation Induced Attenuation in Erbium Doped Fibers and the Sources Using 532-nm and 976-nm Lasers

  • Author

    Peng, Tz-Shiuan ; Huang, Yen-Wei ; Wang, Lon A. ; Liu, Ren-Young ; Chou, Fong-In

  • Author_Institution
    Photonics & Nano-Struct. Lab., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    57
  • Issue
    4
  • fYear
    2010
  • Firstpage
    2327
  • Lastpage
    2331
  • Abstract
    Two erbium doped fibers (EDFs) with different radiation sensitivities were used in the photo-annealing tests, and their photo-annealing efficiencies were compared by using 532-nm and 976-nm lasers. For both EDFs, the 532-nm laser with 10 mW showed better efficiency than 976-nm laser with 290 mW. The radiation induced attenuation (RIA) could nearly be diminished in the wavelength range from 900 nm to 1700 nm by the photo-annealing of 532-nm laser. The half-time of recovery was 5.6 seconds by using 532-nm laser, and was about 40 minutes by using 976-nm laser whose annealing rate was similar to that of purely thermal annealing at about 330°C. For γ-irradiation tests of superfluorescent fiber sources (SFSs) exposed to a dose rate of 129.2 krad/hr, the rate of output power loss could be reduced by the 976-nm pump laser, but the output power loss could not be recovered. A most radiation-tolerant case was an SFS with 2.8-meter EDF#1 co-pumped by both the 532 nm and the 976 nm lasers. The output power loss could be recovered with a rate of 0.009 dB/min.
  • Keywords
    annealing; erbium; fibre lasers; optical pumping; Jk:Er; erbium doped fibers; gamma radiation induced attenuation; lasers; photo-annealing effects; power 10 mW; power 290 mW; superfluorescent fiber sources; time 5.6 s; wavelength 532 nm; wavelength 900 nm to 1700 nm; Annealing; gamma-ray effects; optical fiber radiation effects; radiation hardening; superfluorescent fiber source;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2049372
  • Filename
    5497184