Title :
Improved image quality of terahertz transmission microscope: Example of graphene film observation
Author :
Ishi, Tsutomu ; Sudou, Takayuki ; Oda, Naoki ; Morimoto, Takuya
Author_Institution :
Guidance & Electro-Opt. Div., NEC Corp., Fuchu, Japan
Abstract :
This paper describes non-uniformity reduction in terahertz (THz) imaging system, using a coherent THz source and a THz camera. The beam wobbling technique reduces the interference pattern, but illumination distribution often remains. In order to reduce the illumination distribution, post-image process is applied. In this method, the raw image is divided by the reference image without the sample, which is found effective for improving image quality. The graphene sample is used for validation of this method. The phase shifter is also developed to obtain a high signal-to-noise ratio (SNR) and short image acquisition time in the lock-in imaging.
Keywords :
graphene; terahertz wave detectors; terahertz wave imaging; thin films; transmission electron microscopes; C; THz camera; beam wobbling technique; coherent THz source; graphene film; illumination distribution; image acquisition; image quality; interference pattern; lock-in imaging; nonuniformity reduction; phase shifter; reference image; signal-to-noise ratio; terahertz imaging system; terahertz transmission microscope; Cameras; Films; Graphene; Image quality; Positron emission tomography; Quantum cascade lasers;
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on
Conference_Location :
Tucson, AZ
DOI :
10.1109/IRMMW-THz.2014.6956026