Title :
Practical partial scan test method with no data holding overhead
Author :
Lee, Dong Ho ; Noh, Hyun Chul
Author_Institution :
Sch. of Electron. & Electr. Eng., Kyungpook Nat. Univ., Taegu, South Korea
fDate :
11/20/1997 12:00:00 AM
Abstract :
The partial scan test method has a hidden overhead of data holding during scan shifting. The authors argue that the overhead is avoidable and demonstrate this by presenting a partial scan test method which consists of an FAN-based sequential ATPG algorithm and an ATPG-based partial scan selection algorithm
Keywords :
automatic testing; ATPG-based partial scan selection algorithm; FAN-based sequential ATPG algorithm; partial scan test method;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19971414
