• DocumentCode
    1526557
  • Title

    Nonrandom quantization errors in timebases

  • Author

    Stenbakken, Gerard N. ; Liu, Dong ; Starzyk, Janusz A. ; Waltrip, Bryan C.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    50
  • Issue
    4
  • fYear
    2001
  • fDate
    8/1/2001 12:00:00 AM
  • Firstpage
    888
  • Lastpage
    892
  • Abstract
    Timebase distortion causes nonlinear distortion of waveforms measured by sampling instruments. When such instruments are used to measure the RMS amplitude of the sampled waveforms, such distortions result in errors in the measured RMS values. This paper looks at the nature of the errors that result from nonrandom quantization errors in an instrument timebase circuit. Simulations and measurements on a sampling voltmeter show that the errors in measured RMS amplitude have a nonnormal probability distribution, such that the probability of large errors is much greater than would be expected from the usual quantization noise model. A novel timebase compensation method is proposed which makes the measured RMS errors normally distributed and reduces their standard deviation by a factor of 25. This compensation method was applied to a sampling voltmeter and the improved accuracy was realized
  • Keywords
    error compensation; error statistics; nonlinear distortion; quantisation (signal); signal sampling; time bases; voltmeters; RMS amplitude errors; compensation method; improved accuracy; nonlinear distortion; nonnormal probability distribution; nonrandom quantization errors; probability of large errors; ramp quantization; sampling instruments; sampling voltmeter; simulation model; time bases; waveform distortion; Circuit noise; Circuit simulation; Distortion measurement; Instruments; Noise measurement; Nonlinear distortion; Probability distribution; Quantization; Sampling methods; Voltmeters;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.948294
  • Filename
    948294