A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing

Author

Arpaia, P.

Author_Institution

Dipt. di Ingegneria Elettrica, Naples Univ.

Volume

50

Issue

4

fYear

2001

fDate

8/1/2001 12:00:00 AM

Firstpage

941

Lastpage

948

Abstract

In recent gears, the IEEE 1057-93 Standard (1994) for specifying and testing measurement devices based on analog-to-digital converters (ADCs) earned scientific interest in several topics. In particular, investigations showed the histogram test of the standard to be insensitive to ADC hysteresis. In this paper, an alternative test procedure for determining the dynamic transfer function of an ADC with hysteresis is proposed. The procedure exploits digital signal processing to reduce the large amount of data required by the histogram test. Numerical and experimental results of performance characterization, comparison with a state-of-the-art procedure, and noise-sensitivity analysis are presented and discussed

Keywords

IEEE standards; analogue-digital conversion; hysteresis; integrated circuit testing; numerical analysis; IEEE 1057-94 standard; analog-to-digital converters; digital signal processing; dynamic transfer function; experimental results; histogram test; hysteretic ADC dynamic testing; noise-sensitivity analysis; numerical results; performance; Analog-digital conversion; Digital signal processing; Histograms; Hysteresis; Measurement standards; Standardization; Telecommunication computing; Testing; Transfer functions; World Wide Web;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.948304

Filename

948304