DocumentCode
1526650
Title
Measuring mixed-signal substrate coupling
Author
Rolain, Yves ; Van Moer, Wendy ; Vandersteen, Gerd ; Van Heijningen, Marc
Author_Institution
Dept. of Electr. Meas., Vrije Univ., Brussels, Belgium
Volume
50
Issue
4
fYear
2001
fDate
8/1/2001 12:00:00 AM
Firstpage
959
Lastpage
964
Abstract
A measurement method is proposed to characterize the substrate coupling between digital and analog sections of a mixed-signal CMOS chip. Induced noise and spurious signals can be measured by a custom-designed analog sensor. This paper proposes a method that, when given such a sensor, allows to measure the crosstalk between digital and analog chip sections. Calibrated sampling scope measurements illustrate the performance of the measurement setup
Keywords
CMOS integrated circuits; calibration; crosstalk; electric noise measurement; mixed analogue-digital integrated circuits; network analysers; substrates; time-domain analysis; waveform analysis; calibrated sampling; crosstalk; custom-designed analog sensor; mixed-signal CMOS chip; mixed-signal substrate coupling; substrate coupling; Crosstalk; Differential amplifiers; Integrated circuit measurements; Inverters; Noise measurement; Pollution measurement; Sampling methods; Semiconductor device measurement; Sensor phenomena and characterization; Testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.948307
Filename
948307
Link To Document