Residual surface resistance of YBa/sub 2/Cu/sub 3/O/sub x/ thin films-weakly coupled grain model

Author

Yoshida, K. ; Nagasawa, K. ; Kiss, T. ; Shimakage, H. ; Wang, Z.

Author_Institution

Dept. of Electron. Device Eng., Kyushu Univ., Fukuoka, Japan

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

1253

Lastpage

1256

Abstract

The residual surface resistance and the magnetic penetration depth of high-T/sub c/ superconducting YBa/sub 2/Cu/sub 3/O/sub x/ thin films have been measured using the coplanar waveguide resonator technique, and are discussed with the weakly coupled grain model, where the superconducting polycrystalline thin film is described as a network of superconducting grains coupled via Josephson junctions. The observed dependence of the residual resistance and the magnetic penetration depth on the critical current density and the grain size is shown to demonstrate the weakly coupled grain model of YBa/sub 2/Cu/sub 3/O/sub x/ thin films.

Keywords

Josephson effect; barium compounds; critical current density (superconductivity); grain size; high-temperature superconductors; penetration depth (superconductivity); superconducting thin films; surface conductivity; yttrium compounds; Josephson junctions; YBa/sub 2/Cu/sub 3/O/sub 7/; YBa/sub 2/Cu/sub 3/O/sub x/ thin films; coplanar waveguide resonator technique; critical current density; grain size; high temperature superconductors; magnetic penetration depth; residual surface resistance; superconducting grains; superconducting polycrystalline thin film; weakly coupled grain model; Coplanar waveguides; Couplings; Electrical resistance measurement; Josephson junctions; Magnetic films; Superconducting magnets; Superconducting thin films; Surface resistance; Surface waves; Waveguide junctions;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.620741

Filename

620741