The effect of bending radius on V-I characteristics of mono- and multicored BiPb-2223 tapes with and without Ag additions

Author

Akimov, I.I. ; Antipova, E.V. ; Barabanov, S.N. ; Kozlenkova, N.I. ; Kuznetsov, P.A. ; Nikulin, A.D. ; Rakov, D.N. ; Shikov, A.K. ; Khlebova, N.E. ; Filitchev, D.A.

Author_Institution

Bochvar All-Russia Sci. Res. Inst. of Inorg. Mater, Moscow, Russia

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

1323

Lastpage

1326

Abstract

The effect of bending strain on Voltage-Current Characteristics (VCC) of BiPbSrCaCuO-2223/(Ag and Ag-alloy sheathed) tapes with and without Ag additions into the core have been studied. The testing probe allows us to carry out all set of bending tests up to radius 5 mm on the same specimen. The critical current Ic and shape of high-sensitivity VCC as a function of bending strain are analysed. Degradation of current carrying capacity under bending deformation is caused by the formation of microcracks. The overlapping of microcracks in Bi-2223/Ag sheathed tapes without Ag additions leads to current overflow into the Ag sheath and to appearance of linear resistance segment in the V-I curve at low electric field.

Keywords

bending; bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; microcracks; silver; strontium compounds; (BiPb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10/-Ag; 5 mm; Ag additions; Bi-2223/Ag sheathed tapes; BiPb-2223 tapes; V-I characteristics; bending radius; bending strain; critical current; current carrying capacity degradation; current overflow; high temperature superconductor; linear resistance segment; microcracks; Capacitive sensors; Conducting materials; Degradation; Magnetic field measurement; Multicore processing; Powders; Shape; Silver; Testing; Voltage;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.620769

Filename

620769