Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits

Author

Fedi, Giulio ; Manetti, Stefano ; Piccirilli, Maria Cristina ; Starzyk, Janusz

Author_Institution

Dept. of Electron. Eng., Florence Univ., Italy

Volume

46

Issue

7

fYear

1999

fDate

7/1/1999 12:00:00 AM

Firstpage

779

Lastpage

787

Abstract

A procedure for the determination of an optimum set of testable components in the fault diagnosis of analog linear circuits is presented. The proposed method has its theoretical foundation in the testability concept and in the canonical ambiguity group concept. New considerations relevant to the existence of unique solution in the k-fault diagnosis problem of analog linear circuits are presented, and examples of application of the developed procedure are considered by exploiting a software package based on symbolic analysis techniques

Keywords

analogue integrated circuits; automatic testing; fault diagnosis; integrated circuit testing; network parameters; analog linear circuits; canonical ambiguity group; k-fault diagnosis problem; software package; symbolic analysis techniques; testable components; Application software; Circuit faults; Circuit testing; Fault diagnosis; Fault location; Linear circuits; Nonlinear equations; Software packages; Software prototyping; System testing;

fLanguage

English

Journal_Title

Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on

Publisher

ieee

ISSN

1057-7122

Type

jour

DOI

10.1109/81.774222

Filename

774222