• DocumentCode
    1527345
  • Title

    Electromagnetic properties of high angle [001] twist grain boundaries in Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// bicrystals

  • Author

    Qiang Li ; Tsay, Y.N. ; Zhu, Y. ; Suenaga, M. ; Gu, G.D. ; Koshizuka, N.

  • Author_Institution
    Brookhaven Nat. Lab., Upton, NY, USA
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    1584
  • Lastpage
    1587
  • Abstract
    Detailed measurement of electrical resistivity and V-I curves as a function of temperature and magnetic field up to 9 T were performed on several superconducting Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// (Bi-2212) bicrystals with synthetic high angle [001] twist grain boundaries. We found that the resistive onset temperature and field (at level of 10 nV) for all of the measured high angle twist boundaries were similar to those for their constituent single crystals. Furthermore, these boundaries were able to carry critical current as high as the single crystals. Our results suggested absence of weak-link behavior in the high angle [001] twist grain boundaries of Bi-2212 bicrystals.
  • Keywords
    bismuth compounds; calcium compounds; critical currents; high-temperature superconductors; strontium compounds; superconducting transition temperature; transmission electron microscopy; twist boundaries; 0 to 9 T; 10 to 80 K; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// bicrystals; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/; HRTEM; V-I curves; critical current; electrical resistivity; electromagnetic properties; high angle [001] twist grain boundaries; magnetic field dependence; resistive onset temperature; temperature dependence; Bismuth; Electric resistance; Electric variables measurement; Electromagnetic measurements; Goniometers; Grain boundaries; Magnetic field measurement; Performance evaluation; Strontium; Temperature;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.620878
  • Filename
    620878