• DocumentCode
    1527420
  • Title

    Noncircular Refractive Index Profile and Breakdown of Mode Degeneracy of Vertical Cavity Surface Emitting Lasers

  • Author

    Li, Mingshan ; Zhang, Botao ; Chen, Kevin P. ; Snoke, David W. ; Heberle, Albert P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Pittsburgh, Pittsburgh, PA, USA
  • Volume
    48
  • Issue
    8
  • fYear
    2012
  • Firstpage
    1065
  • Lastpage
    1068
  • Abstract
    Spatially and spectrally resolved near-field images of the transverse mode patterns of vertical cavity surface emitting lasers (VCSELs) are obtained by confocal microscopy with optical spectrum analyzer. A non-circular internal effective index profile of the VCSEL is inferred from the observed wavelength splitting of the degenerated modes. Using the mode intensity patterns associated with their spectral information, an elliptical parabolic profile superposed to a step-like refractive index profile is extracted by fitting the internal structural parameters of VCSEL. Wavelength splitting of the degenerated LG01 modes is calculated from the fitting results, and is found to be in reasonable accord with our experiment results.
  • Keywords
    laser modes; refractive index; surface emitting lasers; VCSEL; confocal microscopy; degenerated modes; elliptical parabolic profile; internal structural parameters; mode degeneracy; mode intensity patterns; noncircular internal effective index profile; noncircular refractive index profile; optical spectrum analyzer; spatially resolved near-field images; spectral information; spectrally resolved near-field images; step-like refractive index profile; transverse mode patterns; vertical cavity surface emitting lasers; wavelength splitting; Cavity resonators; Fitting; Indexes; Laser theory; Refractive index; Vertical cavity surface emitting lasers; Confocal optical microscopy; laser modes; refractive index; vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2012.2201697
  • Filename
    6208806