Title :
Identification and quantification of phases formed during the processing of (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag composite conductors
Author :
Merchant, N.N. ; Fischer, A.K. ; Maroni, V.A. ; Carter, W.L. ; Parrella, R.D.
Author_Institution :
Argonne Nat. Lab., IL, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
Scanning electron microscopy, energy dispersive X-ray analysis (including X-ray dot mapping), X-ray diffraction and computer-based image analysis have been used to study non-superconducting secondary phases that evolve during the processing of (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag composite conductors. These investigations have provided new information and insights about specific alkaline earth cuprates (AECs) and lead-rich phases, We can conclusively identify (Ca,Sr)/sub 2/CuO/sub 3/, (Ca,Sr)/sub 14/Cu/sub 24/O/sub 41/ (14/24), and CuO phases, the alkaline earth plumbates, and a (Bi,Pb)-Sr-Ca-Cu-O 3221 phase with a wide range of Pb/Bi ratios. These techniques also help in differentiating voids from secondary phases and alkaline earth plumbates from the lead-rich 3221 phase.
Keywords :
X-ray chemical analysis; X-ray diffraction; bismuth compounds; calcium compounds; composite superconductors; high-temperature superconductors; lead compounds; scanning electron microscopy; silver; strontium compounds; voids (solid); (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag composite conductors; (BiPb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O-Ag; X-ray diffraction; X-ray dot mapping; alkaline earth plumbates; computer-based image analysis; energy dispersive X-ray analysis; lead-rich 3221 phase; nonsuperconducting secondary phases; scanning electron microscopy; voids; Bismuth; Conductors; Dispersion; Earth; Image analysis; Lead compounds; Scanning electron microscopy; Strontium; X-ray diffraction; X-ray imaging;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
