DocumentCode :
152771
Title :
Emissivity measurement of high-Tc superconductive materials using terahertz passive imaging apparatus with background-limited sensitivity
Author :
Aoki, Masaki ; Hiromoto, N.
Author_Institution :
Grad. Sch. of Eng., Shizuoka Univ., Hamamatsu, Japan
fYear :
2014
fDate :
14-19 Sept. 2014
Firstpage :
1
Lastpage :
2
Abstract :
We have carried out a terahertz (THz) passive measurement of high-Tc superconductive materials down to liquid nitrogen temperature at 1.5-2.5 THz using a 4 K-cryocooled stressed Ge:Ga photoconductive detector. Using the calibration line, which gives the relation between THz signal emitted from sample, emissivity and temperature, we have derived the temperature-dependent THz emissivity of superconductive materials. The result shows that emissivity of superconductive materials steeply change around each superconductive transition temperature. We also demonstrated the THz passive imaging of superconductive wires and successfully obtained THz passive images before and after superconductive transition.
Keywords :
high-temperature superconductors; superconducting transition temperature; terahertz wave spectra; background-limited sensitivity; calibration line; cryocooled stressed Ge:Ga photoconductive detector; frequency 1.5 THz to 2.5 THz; liquid nitrogen temperature; superconductive materials; superconductive transition temperature; temperature 4 K; temperature-dependent terahertz emissivity; terahertz passive imaging apparatus; Detectors; Imaging; Materials; Superconducting transition temperature; Temperature measurement; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on
Conference_Location :
Tucson, AZ
Type :
conf
DOI :
10.1109/IRMMW-THz.2014.6956094
Filename :
6956094
Link To Document :
بازگشت