• DocumentCode
    1527809
  • Title

    High-order pattern discovery from discrete-valued data

  • Author

    Wong, Andrew K.C. ; Wang, Yang

  • Author_Institution
    Dept. of Syst. Design Eng., Waterloo Univ., Ont., Canada
  • Volume
    9
  • Issue
    6
  • fYear
    1997
  • Firstpage
    877
  • Lastpage
    893
  • Abstract
    To uncover qualitative and quantitative patterns in a data set is a challenging task for research in the area of machine learning and data analysis. Due to the complexity of real-world data, high-order (polythetic) patterns or event associations, in addition to first-order class-dependent relationships, have to be acquired. Once the patterns of different orders are found, they should be represented in a form appropriate for further analysis and interpretation. The authors propose a novel method to discover qualitative and quantitative patterns (or event associations) inherent in a data set. It uses the adjusted residual analysis in statistics to test the significance of the occurrence of a pattern candidate against its expectation. To avoid exhaustive search of all possible combinations of primary events, techniques of eliminating the impossible pattern candidates are developed. The detected patterns of different orders are then represented in an attributed hypergraph which is lucid for pattern interpretation and analysis. Test results on artificial and real-world data are discussed toward the end of the paper
  • Keywords
    data analysis; learning (artificial intelligence); pattern recognition; adjusted residual analysis; artificial data; attributed hypergraph; data analysis; discrete-valued data; first-order class-dependent relationships; high-order event associations; high-order pattern discovery; high-order patterns; machine learning; pattern analysis; pattern interpretation; qualitative data set patterns; quantitative data set patterns; real-world data; statistics; Data analysis; Data mining; Databases; Decision making; Machine learning; Pattern analysis; Statistical analysis; Supervised learning; Testing; Unsupervised learning;
  • fLanguage
    English
  • Journal_Title
    Knowledge and Data Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1041-4347
  • Type

    jour

  • DOI
    10.1109/69.649314
  • Filename
    649314