Title :
Implication and referential constraints: a new formal reasoning
Author :
Zhang, Xubo ; Ozsoyoglu, Z. Meral
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
The authors address the issue of reasoning with two classes of commonly used semantic integrity constraints in database and knowledge-base systems: implication constraints and referential constraints. They first consider a central problem in this respect, the IRC-refuting problem, which is to decide whether a conjunctive query always produces an empty relation on (finite) database instances satisfying a given set of implication and referential constraints. Since the general problem is undecidable, they only consider acyclic referential constraints. Under this assumption, they prove that the IRC-refuting problem is decidable, and give a novel necessary and sufficient condition for it. Under the same assumption, they also study several other problems encountered in semantic query optimization, such as the semantics-based query containment problem, redundant join problem, and redundant selection-condition problem, and show that they are polynomially equivalent or reducible to the IRC-refuting problem. Moreover, they give results on reducing the complexity for some special cases of the IRC-refuting problem
Keywords :
constraint handling; database management systems; inference mechanisms; knowledge based systems; query processing; IRC-refuting problem; acyclic referential constraints; complexity; conjunctive query; database instances; database systems; empty relation; formal reasoning; implication constraints; knowledge-base systems; redundant join problem; redundant selection-condition problem; referential constraints; semantic integrity constraints; semantic query optimization; semantics-based query containment problem; Constraint optimization; Database systems; Deductive databases; Logic; Object oriented databases; Polynomials; Query processing; Relational databases; Remuneration; Sufficient conditions;
Journal_Title :
Knowledge and Data Engineering, IEEE Transactions on