Title :
Study of the fluxing agent effects on the properties of no-flow underfill materials for flip-chip applications
Author :
Shi, S.H. ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
As one of the key requirements of the no-flow underfill materials for flip-chip applications, a proper self-fluxing agent must be incorporated in the developed no-flow underfill materials to provide proper fluxing activity during the simultaneous solder reflow and underfill material curing. However, most fluxing agents have some adverse effects on the no-flow underfill material properties and assembly reliability. In this paper, we have extensively investigated the effects of the concentration of the selected fluxing agent on the material properties, interconnect integrity and assembly reliability. Through this work, an optimum concentration window of the fluxing agent is obtained and a routine procedure of evaluating fluxing agents is established
Keywords :
encapsulation; flip-chip devices; integrated circuit reliability; reflow soldering; assembly reliability; flip-chip applications; fluxing agent effects; interconnect integrity; material curing; no-flow underfill materials; solder reflow; Assembly; Corrosion; Curing; Electronics packaging; Integrated circuit technology; Material properties; Materials reliability; Materials science and technology; Temperature; Thermomechanical processes;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/6144.774718