• DocumentCode
    1527951
  • Title

    Parametric dependence of fatigue of electronic adhesives

  • Author

    Gladkov, Alex ; Bar-Cohen, Avram

  • Author_Institution
    Minnesota Univ., Minneapolis, MN, USA
  • Volume
    22
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    200
  • Lastpage
    208
  • Abstract
    Adhesives used in electronic applications are subject to high cyclic shear stresses resulting from differential thermal expansion of the bonded materials. In this study, an attempt has been made to experimentally determine the dependence of the fatigue life of two packaging epoxy adhesives on: temperature, peak cycling stress as a fraction of adhesion strength, and cyclic frequency. Both epoxies were used to bond surfaces of aluminum and silicon. Tensile lap-shear specimens were used
  • Keywords
    adhesives; fatigue; packaging; reliability; thermal expansion; adhesion strength; cyclic shear stresses; differential thermal expansion; electronic adhesives; epoxy adhesives; fatigue life; packaging; peak cycling stress; tensile lap-shear specimens; Adhesives; Aluminum; Bonding; Electronic packaging thermal management; Fatigue; Frequency; Temperature dependence; Tensile stress; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/6144.774732
  • Filename
    774732